2008
Optical
Transmitter Jitter Measurement Basics • APR 2008 *
Combating
Closed Eyes: Pre-Emphasis and Equalization Basics • APR
2008 *
"The
Impact of Clock Recovery on Your Serial Data Measurements" • Presenter:
Steve Sekel • ON-DEMAND WEBCAST hosted by EDN • APR
2008 †
BERTScope
LTS 8500A Lightwave Test Set Product Brief • FEB 2008
Comprehensive Optical Stressed Eye and Transmitter Compliance
Testing Brief • FEB 2008
DisplayPort Sink: VESA DisplayPort MOI, Method of Implementation,
for DisplayPort Sink Jitter Tolerance Tests Using BERTScope
7500B by SyntheSys Research, Inc., Ver. 0.26
• OCT 2007 (Released FEB 2008)
"Signalintegritätsanalyse
und Compliance Testing" • article published in electronik
industrie • Michael Reiss, Laser 2000 • JAN 2008
BERTScope
DPP Digital Pre-Emphasis Processor Product Brief • JAN 2008
"Transmitter
Jitter Basics: Two Worlds of Test" • Presenter:
Charlie Schaffer • ON-DEMAND
WEBCAST hosted by Lightwave • JAN 2008
†
Product Note: Telecom Jitter
Analysis Using the BERTScope and BERTScope DCRJ • JAN
2008 *
DisplayPort Source: VESA DisplayPort MOI, Method of Implementation,
for DisplayPort Source PHY Compliance Tests
Using the BERTScope by SyntheSys Research, Inc., Ver. 0.19 • OCT
2007 (Released JAN 2008)
2007
"Pass PCI Express Physical Layer Compliance Testing
the First Time"
• Presenter: Bent Hessen-Schmidt • ON-DEMAND
WEBCAST hosted by Test & Measurement World
and EDN • DEC 2007 †
"Combating Closed Eyes — Design and
Measurement of Pre-Emphasis and Equalization
for Lossy Channels" • Presenter:
Tom Waschura •
ON-DEMAND WEBCAST hosted by EDN • OCT 2007 †
PCI Express 5.0 GT/s Add-In Card Receiver
Testing, Rev. 1.1 • DEC 2007 *
PCI Express 2.5 GT/s Add-In Card Receiver Testing, Rev. 1.1 • DEC 2007
*
PCI Express Transmitter PLL Testing
— A Comparison of Methods • SEPT 2007 *
BERTScope™ DCRJ 1100A Digital Communications
Receiver: 750-1650 nm Reference Receiver Product
Brief • SEP 2007
PCI Express 2.5 GT/s Add-In Card Transmitter
Testing, Rev. 1.1
• SEP 2007 *
“Gigabit
Signal Integrity Creates New Challenges”
• article published in the
BestTest
Newsletter • AUG 2007
Serial
ATA International Organization Interoperability Program,
Version 1.0, Revision 1.2 Method of Implementation (MOI)
for RSG Tests (using BERTScope 7500B with CR) •
AUG 2007
BERTScope PLA: A Complete PLL Compliance Test
Solution for PCIe Components and Add-In Cards – Product
Brief • AUG 2007
SyntheSys
Research, Inc.: An Innovator in High Speed
Signal Integrity Test and Measurement
Solutions • Charlie
Schaffer
• Interview published May 2007, VOL.
5; Optoelectronic Engineering CommunicAsia
Special;
KamaxOptic Communication Ltd., Taiwan • MAY
2007
"Integration Technologies for Pluggable Backplane
Optical Interconnect System" • Alexei
L. Glebov, Michael G. Lee, Kishio Yokouchi •
Fujitsu Laboratories of America
(First published by SPIE in Optical Engineering, Vol.
46, Iss. 1, 015403) • JAN 2007
5 New Tools to Meet the Challenges of PCIe Gen2,
SATA, & 802.3 Jitter Analysis • JAN
2007 • Bent Hessen-Schmidt • TecPreview
presentation at DesignCon2007
BERTScope™ CRJ Variable
Clock Recovery Jitter Analyzer • Product Brief • JAN
2007
BERTScope™ S:
Eye Openers • De-Emphasis Accessories for Serial
Bus Compliance Measurements • Product Brief • JAN
2007
BERTScope™ S:
Option SSC: Spread Spectrum Clocking Option
Brief • JAN 2007
2006
Product Note: 10 Gb/s Optical Transmitter Testing • DEC 2006
*
"Clock recovery's impact on test and measurement" •
article published in LIGHTWAVE • NOV 2006 ‡
[To
print the article, click here for a white paper version]
[Link to article on LIGHTWAVE site ‡]
PCI Express 1.0a and 1.1 Add-In Card Transmitter
Testing
• NOV 2006
*
PCI Express 2.5 GT/s
Add-In Card Transmitter Testing, Rev. 1.1
• SEP 2007 *
Serial ATA Interoperability Program Method of Implementation
(MOI) for PHY and TSG Device Certification Tests using
the BERTScope by SyntheSys Research, Inc., rev 1.1,
v 1.0 • NOV 2006
BERTScope™ Family Product Brochure: S
12500B/7500B,
SPG,
12500A/7500A • OCT 2006
BERTScope™ Family Technical Specifications • OCT 2006
BERTScope™ S: Signal Integrity Success in
Computer and Storage Applications Technical
Brief • OCT 2006
BERTScope™ CR
Clock
Recovery Instrument Product Brief • OCT 2006
SAS Receiver Jitter Tolerance Testing • SEPT 2006
Measurement Brief: Introduction to Measurement of Skew, Including Methods for SATA
and SAS Transmitter Compliance Testing - SEPT 2006
BERTScope™ SPG
Stressed Pattern Generator Product Overview • AUG 2006
BERTScope™ S: Differential ISI Board Test
Accessory Product Brief • AUG 2006
Serial ATA Gen2 Jitter Tolerance Testing • AUG 2006
Testing the High Speed Electrical Specifications of an XFP Transceiver
• JULY 2006
The Anatomy of Clock Recovery poster, Part 2 • Guy Foster
• MAR 2006
*
The Anatomy of Clock Recovery, Part 1 • MAR 2006
The Anatomy of Clock Recovery, Part 2 • MAR 2006
BERTScope™ Instrument Driver for LabVIEW —
Datasheet by VI Technology • MAR 2006
BERTScope™ Instrument Driver for LabVIEW
— Flyer by VI Technology • MAR 2006
BERTScope™ Instrument Driver for LabVIEW
— download ZIP file from VI Technology
• MAR 2006 †
Measurement Brief: Exploring Power Supply Voltage Sensitivity in an IC •
MAR 2006
Measurement Brief: Signal Integrity of Reference Clock Bleed-Through in an IC
• MAR 2006
Measurement Note: Using the XFI 'EQ Filter' to Equalize a Channel to Enable Eye
Measurements • FEB 2006
The Anatomy of Clock Recovery poster, Part I • Guy Foster
• FEB 2006
*
DesignCon 2006 TecPreview Video on the Web • Bent Hessen-Schmidt
• FEB 2006
†
[Dual-Dirac, Scope Histograms, and BERTScan Measurements • White
Paper • SEPT 2005]
BERTScope eNewsletter #5 • FEB 2006
Stressed Eye: "Know what you're really testing with" •
JAN 2006
Constructing a 10 GbE Optical Stressed Eye • JAN 2006
Constructing a 4x FC Optical Stressed Eye • JAN 2006
2005
Dual-Dirac, Scope Histograms, and BERTScan Measurements • White Paper •
SEPT 2005
[DesignCon 2006 TecPreview Video on
the Web • Bent Hessen-Schmidt • FEB 2006]
†
Stressed Eye Primer v. 1.1 • SEPT 2005
Evaluating Stress Components Using BER-Based Jitter Measurements •
SEPT 2005
BERTScope eNewsletter #4 • SEPT 2005
Measurement Brief: Comparing Sampling Scope and BERTScope Jitter Measurements •
JULY 2005
Measurements of Pre-Emphasis on Altera® Stratix® GX with the BERTScope 12500A
• JUNE 2005
The Importance of Delay Line Accuracy in Making Direct BERTScan Measurements •
JUNE 2005
Compliance Contour — Bridging the Gap between BER and Mask Testing for XFI,
PCI-Express,
OIF-CEI • JUNE 2005
BERTScope eNewsletter #3 • JUNE 2005
BERTScope eNewsletter #2 • MAR 2005
BitAlyzer™ 1500 1.5 Gb/s Error Analyzer Brochure • FEB 2005
BERTScope eNewsletter #1 • JAN 2005
BERTScope-Based Signal Integrity Compliance Testing • White Paper •
Tom Waschura • JAN 2005
[DesignCon 2005 TecPreview Video on the Web •
Tom Waschura • JAN 2005] †
2004
Selecting the Right Bit Error Rate Tester (BERT) • OCT 2004
Anatomy of an Eye Diagram — A Primer • OCT 2004
Anatomy of an Eye Diagram poster • Guy Foster • OCT
2004
A new signal integrity test and measurement architecture for serial 10 Gb/s
interfaces • Tom Lindsay • OCT 2004
Bridging the Gap between BER and Eye Diagrams — A BER Contour
Tutorial • OCT 2004
"High-Speed Digital Test of XFP MSA Modules" • article
published in LIGHTWAVE •
Charlie Schaffer • MAR 2004 ‡
[To
print the article, click here for white
paper version]
[
Link to article on LIGHTWAVE site
‡]
BitAlyzer™ BA14400B-PG 16-Channel Pattern Generator Datasheet •
EB 2004
BitAlyzer™ BA14400B-PD 16-Channel Parallel Detector Datasheet •
FEB 2004
2003
Using Bit Error Rate Testers to Drive Forward Error Correction Codes •
Tom Waschura • SEPT 2003
MVA3000 Multi-Format Video Test System Datasheet • MAR 2003
2002
BER Testing for SFI-4 Applications • Jim Dunford • MAY 2002
HD292 HD-SDI Video Error Analysis System Datasheet • MAY 2002
2001
Testing Applications in Uncompressed HDTV Signals • Jim Waschura •
NOV 2001
SDI Testing — A Toolbox at Your Fingertips • Jim Waschura •
NOV 2001
Digital Channel Error Correction Coding Design Tools •
Jim Waschura • SEPT 2001
HD292 HD-SDI Video Error Analysis System Technical Specifications • 2001
2000
Error Location Analysis Tutorial • MAY 2000
Bit Error Analysis and Beyond • MAR 2000
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