Uncover the secrets of eye diagram analysis with this free poster.

Upcoming Exhibitions and Conferences:

At the show: BERTScope “S” — the latest generation signal integrity analyzer, bringing you:

Learn about Dual-Dirac Jitter Measurements.
Much has been written about the strengths and weaknesses of dual-Dirac as a model for jitter measurement. The aim of this note is to give a gentle introduction to the topic, and how the dual-Dirac method relates to practical measurements that can be made with sampling scopes and BER-based instruments.
›› Download the Dual-Dirac primer here.

Evaluating Stress Components using BER-Based Jitter Measurements.
This comprehensive paper examines the questions; “How can the user tell whether the right amount of jitter is being introduced?” and “What will different stressed eye components look like when measured with deep BER-based jitter analysis?”
›› Download or read the full paper here.

Stressed Eye Primer.
What is stressed eye testing? Where is it used? How does it look in an eye diagram versus a compliance contour plot and why?
›› Download an updated version of the Stressed Eye Primer here.

This is an invitation to receive BERTScope newsletters from SyntheSys Research, Inc. If you would like to receive the e-newsletter, please click to register for BERTScope e-newsletters.

If you have received above email in error or would like to be removed from this list, please accept our apology and send an email to unsubscribe@bertscope.com