- High Speed BER Measurements
- Integrated, Calibrated Stress Generation
- Sinusoidal Jitter to 80 MHz
- Random Jitter
- Bounded, Uncorrelated Jitter
- Sinusoidal Interference
- Electrical Stressed Eye Testing for:
- XFP/XFI
- OIF/CEI
- Fibre Channel
- Serial ATA I/O
- etc.
- Optical Stressed Eye Testing for:
- 10 GbE
- 1, 2, 4, and (in the future)
8x Fiber Channel
- 1 GbE
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- Integrated Eye Diagram Analysis with BER Correlation
- Physical Layer Test Suite with Mask Testing, Jitter Peak, BER Contour, and Q-Factor Analysis
- Compliant Contour Test for Mask Performance Evaluation to
BER 10-12, as called for by latest standards including XFP/XFI and
OIF-CEI
- Pattern Sensitivity Analysis
- Error Free Interval Analysis for periodic jitter identification
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