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BERTScope Si Analyzers with Stress: 26 / 17.5 / 8.5 Gb/s
BERTScope S Analyzers with Stress: 12.5 / 7.5 Gb/s
BERTScope Analyzers:
26 / 17.5 / 12.5 / 7.5 Gb/s
PCIe Test Bench by BERTScope
BERTScope SPG 12.5 Gb/s Stressed Pattern Generator
BERTScope Analyzer Options


 

 

BERTScope S
BERTScope User Interface
RELATED MATERIAL
Download PDF BERTScope Family Brochure PDF
Download PDF BERTScope Technical Specifications PDF
Download PDF Optical Stressed Eye Test Set Technical Brief (PDF)
Download PDF Signal Integrity Success in Computer and Storage Applications (PDF)

The BERTScope User Interface

BERTScope™ Analyzers are designed for applications from 500 Mb/s to 26 Gb/s. They are the industry's first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER pattern generation and analysis.

Sample-rich eye diagrams are swiftly created using the same multi-gigabit/second sampling capability as the BER detection circuit. This provides far more complete characterization of waveform variation with long PRBS or user patterns than existing digital communications analyzers, which are limited to sampling rates below 250 ksamples/second.
 

Eye Diagram

Jitter Map

PatternVu

Eye Diagram thumbnail BER Contour thumbnail CleanEye

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For the first time, eye diagrams give a view of sampled data that is directly correlated to BER measurements. Now, simply adjusting the BERTScope's decision threshold to a mask violation and turning on BitAlyzer® Error Location Analysis™ enables you to easily determine which specific bit and pattern sequence is responsible for an eye diagram mask violation, worst case jitter, or slowest rise time.

Compliance Contour

Stressed Eye Generation

Mask Test

Compliance Contour thumbnail Stress Generation thumbnail Mask Test thumbnail

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The BertScope Analyzer with BitAlyzer Error Location Analysis™ performs seven types of advanced error analysis. Use patented Pattern Sensitivity and Error Free Interval Analysis to swiftly identify pattern-dependent and frequency-dependent errors. Proprietary high-resolution (sub-picosecond), self-calibrating delay lines (patent pending) enable accurate measurement and separation of jitter into deterministic and random components through Jitter Peak (jitter bathtub, BERT scan) Analysis, as well as accurate BER Contour Analysis (again correlated with the sample-rich eye diagram display).

Jitter Peak

Jitter Tolerance

Q-Factor

Jitter Peak thumbnail Jitter Tolerance thumbnail Q-Factor thumbnail

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New high-speed serial interfaces like CEI, XFP/XFI, 10 Gb Ethernet, and both 4 Gb and 8 Gb Fibre Channel are creating new demands for test and detailed performance analysis. SyntheSys Research BERTScope Analyzers feature true differential outputs and inputs with variable decision threshold settings, critical for accurate differential I/O testing and analysis, such as Q-Factor and BER Contour. BERTScopes reduce required capital investments, by simplifying and speeding test and detailed performance analysis with built-in sinusoidal jitter generation and jitter tolerance testing together with integrated stressed eye generation and testing.

Correlation

2-D Image Map

Error Free Interval

Correlation thumbnail 2-D Image Map Error Free Interval thumbnail

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