- Total, Bit, and Burst Error Rates and Counts
- Strip Chart of Error Rates
- Histogram of Error Free Intervals
- Distribution of Error Occurrences per Block
- Error Correlation to External Marker Input
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- Histogram of Pattern Sensitivity
- Multi-Channel BER Measurements in TDMA Formats
- Error Position Auto-Correlation
- Burst Length Histogram
- Error Free Interval Histogram
- Forward Error Correction Emulation
- 2-D Error Mapping
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...plus Physical Layer Testing: |
- Automatic RJ & DJ Jitter Measurements
- BER Bathtubs with Q-factor Measurements
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- Very Fast Eye Mask Tests
- Pattern Generation
- Bit Error Detection
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Error Detector
Errors are Identified by comparing the incoming data stream with the expected sequence,
bit-by-bit. Differential and single-ended inputs are supported, and adjustments for
threshold level and termination voltage are allowed.
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Pattern Generator
Internal data generator is capable of generating one of five
pseudo-random data streams, or a user-defined 8-Mbit sequence.
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Pattern Sensitivity
Identify data-dependent errors. Shows the number of errors
for every bit position of built-in PRBS patterns, or user-defined patterns.
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Burst Length Analysis
Quantifying the occurrences of bursts of different lengths, this chart can measure
the probability of having errors of given lengths and qualitatively analyze a
channel's baseline performance.
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Error Correlation
Find correlations between system architectures or physical events and errors. Set a
block size as either a fixed number of bits (i.e., a data bus width) or an external
Marker input, to see how errors correlate.
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Error Free Interval
Shows how often different error free intervals have occurred. Intervals that occur
more often indicate systematic, rather than random, error behavior. The length of
a repetitive error free interval points to the frequency of interference, giving
an excellent clue to possible causes.
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Eye Pattern Display
Automatic eye measurements include amplitude, rise/fall time, overshoot/undershoot, and
total jitter. The eye pattern display shows the combination of effects from your signal
and the BER decision circuit.
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Jitter Peak
Provides Random, Deterministic, and Total Jitter measurements automatically, using
the fast BER-scan technique. No competing technique can match the data-gathering
efficiency of using BER scan data.
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Q-Factor
Q-factor is to the amplitude domain what jitter is to the time domain. It indicates
how clean the vertical eye opening is, which relates to the ease of making a 1 or 0
logic decision. The results of Q-factor analysis show the best predicted BER value
expected, along with the optimum decision level voltage.
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BER Contour
This analysis computes the bit error rate around the perimeter of the eye opening,
then fits the results to the expected BER response curves. The depth of the contours
can then be extrapolated to lower levels than actual measurement would allow.
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Mask Test
A BER-based scan technique provides mask perimeters inside, above, and below the
eye in a few seconds, with high confidence. Standard templates are available, along
with the capability to create custom masks and use the BER Contour analysis results
as a "golden" mask for a prescribed BER level.
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2-D Error Mapping
A BER-based scan technique provides mask perimeters inside, above, and below the
eye in a few seconds, with high confidence. Standard templates are available, along
with the capability to create custom masks and use the BER Contour analysis results
as a "golden" mask for a prescribed BER level.
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